Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Embra Finder 400 mesh Grid, Gold
Standard 3.05 mm diameter grids which have one straight and one round cut out from the rim which assists in the orientation of the grid.
Grid: Gold
Electron Microscopy Sciences Whipple Grid Graticle NE29, 21 mm, 100 squares in 7 mm
Originally designed for water particle analysis, but may be used for other aspects of particle counting. Grid showed: Ratio of full square to smallest is 50:1. Area is 2500:1. Reference: Microscopy of Drinking Water.
Size: 21 mm
Divisions: 100 squares in 7 mm
Electron Microscopy Sciences Whipple Grid Graticle NE29, 19 mm, 100 squares in 7 mm
Originally designed for water particle analysis, but may be used for other aspects of particle counting. Grid showed: Ratio of full square to smallest is 50:1. Area is 2500:1. Reference: Microscopy of Drinking Water.
Size: 19 mm
Divisions: 100 squares in 7 mm
Electron Microscopy Sciences PS1 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Electron Microscopy Sciences Thin Sample Holder, 8 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For most AMRAY: 1/2" diameter (12.7mm), 1/8" (3.1mm)dia. Pin (3.1mm) with split openings up to 1/4" (6.4mm), with 8mm (5/16") pin height
Electron Microscopy Sciences Synaptek NOTCH-DOT Grid with 2x1 mm slot, Beryllium-Copper
Synaptek unflexible grids are made of a special Beryllium-Copper alloy and very reliable under the electron beam. Offer extreme stability for coating with support film. 4 mil thick (100um), 3.05 mm diameter. Contamination free and reusable after cleaning.
I.D.: 2x1 mm slot
Material: Beryllium-Copper
Electron Microscopy Sciences SEM Very High Resolution Gold on Carbon Test Specimen, JEOL Stub
For very high resolution performance testing this specimen has a smaller gold particle size ranging from 2 nm to 30 nm as compared to the high resolution test above. Ideal for testing at instrument magnifications of 50,000x and above.
Mount: JEOL Stub
Electron Microscopy Sciences X-Checker™ Calibration Aid for SEM/EDS Standard
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. Each X-Checker comes with manganese to measure full width at half max detector resolution, aluminum and copper to perform spectral calibration, and carbon to monitor calibration at the low end of the spectra for thin window detectors. You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window. Comes with: manganese, aluminum and copper, carbon.
Electron Microscopy Sciences Walton & Beckett Graticule G24, 16 mm, 5:1 ratio
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. 5:1 ratio is useful where the majority of fibers to be counted are shorter than 5 um.
Size: 16 mm
Electron Microscopy Sciences SEM Ultra High Resolution Gold on Carbon Test Specimen, JEOL Stub
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Mount: JEOL Stub
Electron Microscopy Sciences PS4 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Electron Microscopy Sciences Walton & Beckett Graticule G25, 16 mm,
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. Based on the G22. The G25 is produced by the Institute of Occupational Health.
Size: 16 mm
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum polished finish with a smooth and luster surface.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Carbon, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from spectroscopically pure carbon.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"